"Body Bias Impact on ION Degradation in SiGe-Channel pMOS without Si-Cap ..."

Dibyendu Chatterjee et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529464

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Dibyendu Chatterjee, Uma Sharma, Hiroshi Murai, Tomohiko Kudo, Raghu Singanamalla, Haitao Liu:
Body Bias Impact on ION Degradation in SiGe-Channel pMOS without Si-Cap for DRAM Periphery. IRPS 2024: 22

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