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"BEOL TDDB reliability modeling and lifetime prediction using critical ..."

Pin-Shiang Chen et al. (2018)

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DOI: 10.1109/IRPS.2018.8353626

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-08

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  dblp key:
  - conf/irps/ChenLOL18
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Pin-Shiang Chen, Shou-Chung Lee, A. S. Oates, Chee Wee Liu:
BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown. IRPS 2018: 6

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