"From BTI variability to product failure rate: A technology scaling ..."

Vincent Huard, D. Angot, Florian Cacho (2015)

> Home

Details and statistics

DOI: 10.1109/IRPS.2015.7112763

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/HuardAC15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/HuardAC15
Vincent Huard, D. Angot, Florian Cacho:
From BTI variability to product failure rate: A technology scaling perspective. IRPS 2015: 6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.