- Y. Ji, H. J. Goo, J. Lim, T. Y. Jeong, T. Uemura, G. R. Kim, B. I. Seo, S. Lee, G. Park, J. Jo, S. I. Han, K. Lee, J. Lee, S. H. Hwang, D. S. Lee, S. Pyo, H. T. Jung, S. H. Han, S. Noh, K. Suh, S. Y. Yoon, H. Nam, H. Hwang, H. Jiang, J. W. Kim, D. Kwon, Y. J. Song, K. H. Koh, H. S. Rhee, Sangwoo Pae, E. Lee:
Reliability of Industrial grade Embedded-STT-MRAM. IRPS 2020: 1-3
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