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"Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: ..."

Dongyoung Kim, Nick Yun, Woongje Sung (2021)

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DOI: 10.1109/IRPS46558.2021.9405109

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Dongyoung Kim, Nick Yun, Woongje Sung:
Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: Experimental Analysis and Simulation Study. IRPS 2021: 1-4

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