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ORCID"Robustness of GaN Gate Injection Transistors under Repetitive Surge Energy ..."
Joseph P. Kozak et al. (2021)
- Joseph P. Kozak, Qihao Song, Ruizhe Zhang, Jingcun Liu, Yuhao Zhang:
Robustness of GaN Gate Injection Transistors under Repetitive Surge Energy and Overvoltage. IRPS 2021: 1-5
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