"Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate ..."

Satyam Kumar et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405155

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-21

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Satyam Kumar, Tarun Samadder, Karansingh Thakor, Uma Sharma, Souvik Mahapatra:
Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. IRPS 2021: 1-5

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