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"AC stress reliability study of a new high voltage transistor for logic ..."
Jordan Locati et al. (2020)
- Jordan Locati, Vincenzo Della Marca, Christian Rivero, Arnaud Régnier, Stephan Niel, Karine Coulié:
AC stress reliability study of a new high voltage transistor for logic memory circuits. IRPS 2020: 1-5
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