"Dynamic Reverse Bias Reliability Testing of SiC MOSFETs."

Vamsi Mulpuri et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983571

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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Vamsi Mulpuri, Vishank Talesara, Kailun Zhong, Siddarth Sundaresan, Navitas Semiconductor:
Dynamic Reverse Bias Reliability Testing of SiC MOSFETs. IRPS 2025: 1-4

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