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"Physics based modeling of bimodal electromigration failure distributions ..."

Sarath Mohanachandran Nair et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128313

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/irps/NairBTZCGKC20
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  - https://dblp.org/rec/conf/irps/NairBTZCGKC20
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor:
Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects. IRPS 2020: 1-5

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