default search action
"Reliability Assesement of Ferroelectric nvCAP for Small-Signal Capacitive ..."
Omkar Phadke et al. (2024)
- Omkar Phadke, Halid Mulaosmanovic, Stefan Dünkel, Sven Beyer, Shimeng Yu:
Reliability Assesement of Ferroelectric nvCAP for Small-Signal Capacitive Read-Out. IRPS 2024: 1-5
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.