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"Effect of measurement speed (μs-800 ps) on the characterization of ..."

Yiming Qu et al. (2018)

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DOI: 10.1109/IRPS.2018.8353644

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  dblp key:
  - conf/irps/QuCLLNFXCZ18
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  - https://dblp.org/rec/conf/irps/QuCLLNFXCZ18
Yiming Qu, Ran Cheng, Wei Liu, Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao:
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs. IRPS 2018: 6

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