"Reliability Characterization for 12 V Application Using the 22FFL FinFET ..."

Chen-Yi Su et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128314

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-17

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Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young:
Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology. IRPS 2020: 1-5

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