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"Soft- and Hard-Error Radiation Reliability of 228 KB ..."

H. Takahashi et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118302

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/irps/TakahashiOHKWTSMAOKYKIMO23
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  persistent URL:
  - https://dblp.org/rec/conf/irps/TakahashiOHKWTSMAOKYKIMO23
H. Takahashi, Y. Okamoto, Toshiki Hamada, Yusuke Komura, S. Watanabe, K. Tsuda, H. Sawai, Takanori Matsuzaki, Yoshinori Ando, Tatsuya Onuki, Hitoshi Kunitake, Shunpei Yamazaki, D. Kobayashi, A. Ikuta, Takahiro Makino, Takeshi Ohshima:
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory. IRPS 2023: 1-6

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