"A New Methodology to Precisely Induce Wake-Up for Reliability Assessment ..."

Tiang Teck Tan et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117723

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Tiang Teck Tan, Yu-Yun Wang, Joel Tan, Tian-Li Wu, Nagarajan Raghavan, Kin Leong Pey:
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices. IRPS 2023: 1-7

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