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"PBTI and HCI degradations of ultrathin body InGaAs-On-Insulator nMOSFETs ..."

Xiaoyu Tang et al. (2015)

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DOI: 10.1109/IRPS.2015.7112838

access: closed

type: Conference or Workshop Paper

metadata version: 2017-10-19

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  - conf/irps/TangLZZWLSHK15
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  - https://dblp.org/rec/conf/irps/TangLZZWLSHK15
Xiaoyu Tang, J. Lu, Rui Zhang, Yi Zhao, Wangran Wu, Chang Liu, Yi Shi, Ziqian Huang, Yuechan Kong:
PBTI and HCI degradations of ultrathin body InGaAs-On-Insulator nMOSFETs fabricated by wafer bonding. IRPS 2015: 7

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