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"Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D ..."

Nian-Jia Wang et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128993

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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  dblp key:
  - conf/irps/WangLLHLKLCL20
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  - https://dblp.org/rec/conf/irps/WangLLHLKLCL20
Nian-Jia Wang, Kuan-Yi Lee, Hsin-Yi Lin, Wei-Hao Hsiao, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, Chih-Yuan Lu:
Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories. IRPS 2020: 1-5

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