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"Customized wafer level verification methodology: quality risk ..."

Jiyoung Yoon et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117800

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  - conf/irps/YoonLSKLKLPKP23
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  - https://dblp.org/rec/conf/irps/YoonLSKLKLPKP23
Jiyoung Yoon, Bumgi Lee, Jaehee Song, Bokyoung Kang, Sangho Lee, Doh-Soon Kwak, Heonsang Lim, Ilsang Park, Jonghoon Kim, Sangwoo Pae:
Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations. IRPS 2023: 1-6

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