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"Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier ..."

Ri-an Zhao et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118309

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/ZhaoKLW23
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  - https://dblp.org/rec/conf/irps/ZhaoKLW23
Ri-an Zhao, Matthew Koskinen, Yang Liu, Xinggong Wan:
Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET. IRPS 2023: 1-6

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