"A Fast DCIV Technique for Characterizing the Generation and Repassivation ..."

Longda Zhou et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405105

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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Longda Zhou, Zhaohao Zhang, Hong Yang, Zhigang Ji, Qianqian Liu, Qingzhu Zhang, Eddy Simoen, Huaxiang Yin, Jun Luo, Anyan Du, Chao Zhao, Wenwu Wang:
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. IRPS 2021: 1-7

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