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"Characterization of 1/f noise vs. number of gate stripes in MOS transistors."

Hsin-Shu Chen, A. Ito (1999)

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DOI: 10.1109/ISCAS.1999.780720

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Hsin-Shu Chen, A. Ito:
Characterization of 1/f noise vs. number of gate stripes in MOS transistors. ISCAS (2) 1999: 310-313

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