"A tunable, robust pseudo-resistor with enhanced linearity for scanning ..."

Denis Djekic et al. (2016)

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DOI: 10.1109/ISCAS.2016.7527372

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Denis Djekic, Maurits Ortmanns, Georg E. Fantner, Jens Anders:
A tunable, robust pseudo-resistor with enhanced linearity for scanning ion-conductance microscopy. ISCAS 2016: 842-845

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