"Electronically programmable test points for on-chip analog/digital ..."

Murillo Franco et al. (2013)

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DOI: 10.1109/ISCAS.2013.6572428

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-17

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Murillo Franco, Jairo Güiza, Erasmo Chiappetta, Sergio Rueda, H. Luis, J. Bertuzzo, Jim Koeppe, Tim Robins, Julian Jenkins, Tara Julia Hamilton:
Electronically programmable test points for on-chip analog/digital measurements. ISCAS 2013: 2670-2673

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