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"Built-In Self Test (BIST) Design of High-Speed Carry-Free Dividers."

Chin-Long Wey (1995)

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DOI: 10.1109/ISCAS.1995.523793

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  dblp key:
  - conf/iscas/Wey95
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  - https://dblp.org/rec/conf/iscas/Wey95
Chin-Long Wey:
Built-In Self Test (BIST) Design of High-Speed Carry-Free Dividers. ISCAS 1995: 1916-1919

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