"Impacts of NBTI and PBTI on Power-gated SRAM with High-k Metal-gate Devices."

Hao-I Yang, Ching-Te Chuang, Wei Hwang (2009)

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DOI: 10.1109/ISCAS.2009.5117764

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Hao-I Yang, Ching-Te Chuang, Wei Hwang:
Impacts of NBTI and PBTI on Power-gated SRAM with High-k Metal-gate Devices. ISCAS 2009: 377-380

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