"A Time-optimized Test-Solution Scheme for the Analysis of Permanent Faults ..."

Biswajit Bhowmik (2018)

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DOI: 10.1109/ISED.2018.8703881

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-09

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Biswajit Bhowmik:
A Time-optimized Test-Solution Scheme for the Analysis of Permanent Faults on NoC Interconnects. ISED 2018: 188-193

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