"Highly Sensitive ?R/R Measurement System for Nano-electro-Mechanical ..."

Sandeep Goud Surya et al. (2011)

Details and statistics

DOI: 10.1109/ISED.2011.36

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics