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"Correlation Aware Random Pattern Generation for Test Time and Shift Power ..."

Jongho Park et al. (2022)

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DOI: 10.1109/ISOCC56007.2022.10031357

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-15

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  dblp key:
  - conf/isocc/ParkLLPK22
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Jongho Park, Sangjun Lee, Inhwan Lee, Sungwhan Park, Sungho Kang:
Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST. ISOCC 2022: 53-54

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