"A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm ..."

Choongyeun Cho et al. (2007)

Details and statistics

DOI: 10.1109/ISQED.2007.8

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics