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"DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path."

Makoto Ikeda, Hideyuki Aoki, Kunihiro Asada (2000)

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DOI: 10.1109/ISQED.2000.838887

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/IkedaAA00
Makoto Ikeda, Hideyuki Aoki, Kunihiro Asada:
DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path. ISQED 2000: 305-308

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