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"An accurate modeling method utilizing application-specific statistical ..."

Hidetoshi Matsuoka et al. (2010)

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DOI: 10.1109/ISQED.2010.5450411

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  - conf/isqed/MatsuokaIHT10
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Hidetoshi Matsuoka, Hiroshi Ikeda, Hiroyuki Higuchi, Yoshinori Tomita:
An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation. ISQED 2010: 22-28

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