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"A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs."

Violeta Petrescu et al. (2006)

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DOI: 10.1109/ISSCC.2006.1696283

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-28

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Violeta Petrescu, Marcel J. M. Pelgrom, Harry J. M. Veendrick, Praveen Pavithran, Jean Wieling:
A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs. ISSCC 2006: 2220-2229

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