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"Concurrency Defect Localization in Embedded Systems using Static Code ..."

Bjarne Johansson, Alessandro Vittorio Papadopoulos, Thomas Nolte (2019)

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DOI: 10.1109/ISSREW.2019.00034

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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Bjarne Johansson, Alessandro Vittorio Papadopoulos, Thomas Nolte:
Concurrency Defect Localization in Embedded Systems using Static Code Analysis: An Evaluation. ISSRE Workshops 2019: 7-12

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