"Quantification of Sense Amplifier Offset Voltage Degradation due to ..."

Innocent Agbo et al. (2016)

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DOI: 10.1109/ISVLSI.2016.30

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene:
Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. ISVLSI 2016: 725-730

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