"Spatio-temporal wafer-level correlation modeling with progressive ..."

Ali Ahmadi et al. (2014)

> Home

Details and statistics

DOI: 10.1109/TEST.2014.7035325

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/AhmadiHNCM14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/AhmadiHNCM14
Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris:
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. ITC 2014: 1-10

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.