Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for ..."

Sudarshan Bahukudumbi, Krishnendu Chakrabarty (2006)

> Home

Details and statistics

DOI: 10.1109/TEST.2006.297646

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/BahukudumbiC06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BahukudumbiC06
Sudarshan Bahukudumbi, Krishnendu Chakrabarty:
Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs. ITC 2006: 1-10

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.