"Application of Sampling in Industrial Analog Defect Simulation."

Mayukh Bhattacharya, Beatrice Solignac, Michael Dürr (2022)

> Home

Details and statistics

DOI: 10.1109/ITC50671.2022.00051

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/BhattacharyaSD22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BhattacharyaSD22
Mayukh Bhattacharya, Beatrice Solignac, Michael Dürr:
Application of Sampling in Industrial Analog Defect Simulation. ITC 2022: 436-445

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.