"A highly testable and diagnosable fabrication process test chip."

Dilip K. Bhavsar et al. (1998)

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DOI: 10.1109/TEST.1998.743274

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/BhavsarEAB98
Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill:
A highly testable and diagnosable fabrication process test chip. ITC 1998: 853-861

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