"SmartScan - Hierarchical test compression for pin-limited low power designs."

Krishna Chakravadhanula et al. (2013)

Details and statistics

DOI: 10.1109/TEST.2013.6651897

access: closed

type: Conference or Workshop Paper

metadata version: 2017-12-06

a service of  Schloss Dagstuhl - Leibniz Center for Informatics