"A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High ..."

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi (2004)

Details and statistics

DOI: 10.1109/TEST.2004.1387385

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics