"Stuck-Open and Transition Fault Testing in CMOS Complex Gates."

Henry Cox, Janusz Rajski (1988)

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DOI: 10.1109/TEST.1988.207853

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Henry Cox, Janusz Rajski:
Stuck-Open and Transition Fault Testing in CMOS Complex Gates. ITC 1988: 688-694

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