"A Cell-aware Transistor State Stress Model and its Application for Quality ..."

Stephan Eggersglüß, Andreas Glowatz (2024)

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DOI: 10.1109/ITC51657.2024.00016

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Stephan Eggersglüß, Andreas Glowatz:
A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. ITC 2024: 41-45

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