"Automatic Test Pattern Generation for Asynchronous Networks."

Brian J. Heard et al. (1984)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-11-22

- no documents available
- export record
  dblp key:
  - conf/itc/HeardSDS84
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/HeardSDS84
Brian J. Heard, Ramu N. Sheshadri, Ronald B. David, Arvid G. Sammuli:
Automatic Test Pattern Generation for Asynchronous Networks. ITC 1984: 63-69

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.