"A New Framework for Analyzing Test Generation and Diagnosis Algorithms for ..."

Najmi T. Jarwala, Chi W. Yau (1989)

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DOI: 10.1109/TEST.1989.82278

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Najmi T. Jarwala, Chi W. Yau:
A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. ITC 1989: 63-70

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