"A development platform and electronic modules for automated test up to 20 ..."

David C. Keezer et al. (2009)

> Home

Details and statistics

DOI: 10.1109/TEST.2009.5355701

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  authority control:
- export record
  dblp key:
  - conf/itc/KeezerGMMD09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/KeezerGMMD09
David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme:
A development platform and electronic modules for automated test up to 20 Gbps. ITC 2009: 1-11

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.