"A generic and reconfigurable test paradigm using Low-cost integrated ..."

Jing Li, Swaroop Ghosh, Kaushik Roy (2007)

Details and statistics

DOI: 10.1109/TEST.2007.4437622

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics