"Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant."

Shu-Wen Li et al. (2024)

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DOI: 10.1109/ITC51657.2024.00023

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao:
Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant. ITC 2024: 76-80

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