"On static test compaction and test pattern ordering for scan designs."

Xijiang Lin et al. (2001)

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DOI: 10.1109/TEST.2001.966735

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Xijiang Lin, Janusz Rajski, Irith Pomeranz, Sudhakar M. Reddy:
On static test compaction and test pattern ordering for scan designs. ITC 2001: 1088-1097

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