"High Throughput Diagnosis via Compression of Failure Data in Embedded ..."

Nilanjan Mukherjee et al. (2008)

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DOI: 10.1109/TEST.2008.4700554

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-01

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Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. ITC 2008: 1-10

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