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"SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: ..."
Sujay Pandey et al. (2020)
- Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee:
SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. ITC 2020: 1-10
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